NAP9600E can provide customers higher accuracy and precision.
NAP9600E with Si-pin detector delivers wide elemental coverage with an easy-to-learn software. Non-destructively analyze from sodium (Na) through uranium (U) in powders, liquids and solids. It is designed exactly to security standards with active radiation protection, high voltage protection and X-ray tube overheating protection. Stable software system, Warm-up and anti-interference procedure is controlled by the program, to reduce the interference by the reflected X-ray and the spectrums, to improve the accuracy and stability.
|Working Principle||Energy Dispersive X-ray Fluorescence|
|Detection limit||100ppm Best substance effect|
|Precision||±0.01% in homogeneously melted sample|
|Operating Environment||Temperature -11~25°C,Humidity ≤70%|
|Testable Elements||Au,Ag,Pt,Cu,Ni,Zn,Pd,Cd,In,Ir,Rh,Ru,Co,Mn,Fe,Sn etc.|
|Main Structure||High-strength metal frame and industry plastic shell|
|N/G Weight(KG)||33 / 41|
|Measurement time||30 seconds to 100 seconds|
|Scanning area||2-5 mm expandable spot ± 40 micron|
|Power consumption||70 watts|
|Software||I. R. D. - C F - 9600|