SI Pin EXF 9600 can provide customers higher accuracy and precision.
SI Pin EXF 9600 with Si-pin detector delivers wide elemental coverage with an easy-to-learn software. Non-destructively analyze from sodium (Na) through uranium (U) in powders, liquids and solids. It is designed exactly to security standards with active radiation protection, high voltage protection and X-ray tube overheating protection. Stable software system, Warm-up and anti-interference procedure is controlled by the program, to reduce the interference by the reflected X-ray and the spectrums, to improve the accuracy and stability
Specifications | SI Pin EXF 9600 |
---|---|
Model | SI Pin EXF 9600 |
Analysis Range | 1% - 99.99% |
Detector | Si-Pin Diode Detector |
Precision | ±0.01% under optimized test conditions with homogenous sample |
Operating Environment | 10-45 Deg Celsius, less than 95% humidity |
High Voltage | 4-50 Kv |
Testable Elements | Au,Ag,Pt,Cu,Ni,Zn,Pd,Cd,In,Ir,Rh,Ru,Co,Mn,Fe,tin etc. |
Main Structure | ABS moulded and Xray protected |
N/G Weight(KG) | 31 kg |
Dimensions (mm) | 670*400*330mm |
Measurement time | 30-200 seconds Auto mode available 60 sec for best results |
Scanning area | 1-5 mm expandable spot ± 40 micron |
Power consumption | 144 watts |
Software | XRF 7.0 with auto adjustment of hardware parameter |
PC /Laptop interface | Inbuilt PC with USB port for connectivity special touch screen interface optional printer interface |
ADVANCED GOLD TESTING MACHINE WITH SIPIN DETECTOR CAPABLE OF DETECTING MAXIMUM ELEMENTS INCLUDING POWDERS – IRIDIUM,OSMIUM,RUTHENIUM AND GIVING ACCURATE RESULTS. BEST FOR PROFESSIONAL GOLD TESTING CENTRES – TUNCH CENTRES AND HALL MARKING CENTRES. CAPABLE OF DEEP ANALYSIS AND QUICK RELIABLE RESULTS. PRINTER CAN BE INTERFACED TO GIVE PRINTOUT WITH PICTURE OF ITEM SCANNED. QUICK EASY AND NON DESTRUCTIVE METHOD OF CHECKING THE PURITY OF GOLD FAST AND ACCURATE.